| Introduction | Perspectives on XPS and AES – David Briggs and John Grant, XPS: Basic Principles, Spectral Features and Qualitative Analysis – David Briggs, AES: Basic Principles, Spectral Features and Qualitative Analysis – John Grant |
| Instrumentation | Surface Analysis: The Specimen’s Journey from Collection, Storage, Transportation, and Preparation to Analysis – Joe Geller, XPS: Instrumentation and Performance – Ian Drummond, AES: Instrumentation and Performance – Masato Kudo, Instrument Calibration for AES and XPS – Martin Seah, Analysing Insulators with XPS and AES – Mike Kelly, Beam Effects During AES and XPS Analysis – Don Baer, Mark Engelhard, Dan Gaspar and Scott Lea |
| Surface Sensitivity | Electron Transport in Solids – Wolfgang Werner, Electron Attenuation Lengths – Shigeo Tanuma |
| Quantification | Quantification of Nanostructures by Electron Spectroscopy – Sven Tougaard, Quantification in AES and XPS – Martin Seah, The Use of Chemometrics in AES and XPS Data Treatment – Bill Stickle |
| Spectral Interpretation | XPS Lineshapes and Curve-fitting – Neal Fairley, Chemical Effects in XPS – Laszlo Kover, Chemical Information from Auger Lineshapes – Dave Ramaker, The Auger Parameter – Giuliano Moretti, XPS Valence bands studied by XPS – Peter Sherwood, Structural Effects in XPS and AES: Diffraction – Jürg Osterwalder, Electron Backscattering and Channeling – Ding Ze-jun and Ryuichi Shimizu |
| Depth Profiling | AES/XPS Depth Profiling – Thomas Wagner, Jy Wang and Siegfried Hofmann, Angle Resolved XPS – Peter Cumpson |
| Imaging | XPS Imaging – Kateryna Artyushkova and Julia Fulghum, Processing, Interpretation and Quantification of Auger Images – Martin Prutton |
| Developing Aspects | X-ray Photoelectron Spectroscopy and Imaging at Synchrotrons – Giorgio Margaritondo, Total Reflection X-ray Photoelectron Spectroscopy (TRXPS) – Yoshitoki Iijima, Ion-Excited Auger Electron Spectroscopy – John Grant, Positron-Annihilation Induced AES (PAES) – Toshiyuki Ohdaira, Electron Coincidence Measurements – Steve Thurgate, Recent Developments in the Theory of Auger Spectroscopy – Peter Weightman |
| Appendices | XPS BE, AES KE, Beam Damage, Manufacturers, Software, Databases, Standards |
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