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Eur. J. Mass Spectrom. 2, 91 - 114 (1996) |
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Account: Surface ionization organic mass spectrometry: mechanism | ||
Toshihiro Fujii |
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ABSTRACT: | ||
Surface ionization organic mass spectrometry (SIOMS) is described and developments are summarized. SIOMS has a unique and interesting potential, especially in analytical chemistry. Surface ionization (SI) has direct relevance to any experiment in mass spectrometry, in which organic compounds come into contact with hot metal surfaces. The work covered in this Account was mostly carried out in the author's laboratory. The review includes 1) pertinent basic theories, 2) mechanism, 3) response characteristics, together with mass spectra of the classified compounds, 4) instrumentation and 5) applications in mass spectrometry and gas chromatography. The literature on SIOMS is summarised in the form of nominal mass numbers m/z, ordered serially, followed by possible ionic structures and precursor molecules. | ||
Keywords: |
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