Creeping discharge mass spectrometry: a new method for elemental analysis of dielectrics

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Eur. J. Mass Spectrom. 8, 207 - 212 (2002)
DOI: 10.1255/ejms.493

Creeping discharge mass spectrometry: a new method for elemental analysis of dielectrics

L.N. Gall and A.G. Kouzmin^*
Institute for Analytical Instrumentation, Rizhski av. 26, 198103 Saint-Petersburg, Russia

ABSTRACT:

The creeping discharge (CD), a special kind of surface discharge, is proposed as a method of ionization in mass spectrometry for elemental analysis of dielectrics. Characteristic features of creeping discharge ionization mass spectra of dielectric samples were studied. An yttrium oxide standard sample and dielectrics of high electric strength were successfully analyzed. The results of analysis of the ion charge state in creeping discharge are presented. A theoretical model of creeping discharge ionization is offered.

Keywords: creeping discharge, mass spectrometry, ion source, elemental analysis, dielectrics, plasma

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