High-resolution electrospray ionization orthogonal-injection time-of-flight mass spectrometer

Eur. J. Mass Spectrom. 6, 481 – 490 (2000)
DOI: 10.1255/ejms.378

High-resolution electrospray ionization orthogonal-injection time-of-flight mass spectrometer

A.F. Dodonov, V.I. Kozlovski, I.V. Soulimenkov and V.V. Raznikov
Institute of Energy Problems in Chemical Physics RAS (branch), Chernogolovka, Russia
A.V. Loboda
SCIEX, Concord, Ontario, Canada
Zhou Zhen, T. Horwath and H. Wollnik
II Physikalisches Institut, Justus Liebig Universität, Giessen, Germany

ABSTRACT:

A concept of an “ideal” orthogonal-injection time-of-flight (O-TOF) mass spectrometer is proposed and a new high- resolution O-TOF mass spectrometer with an electrospray ion source and a molecule-ion reactor is described. The instrument design was optimized for high resolution and sensitivity using the concept of an ideal O-TOF mass spectrometer. A mass resolving power of about 20,000 (full width at half maximum) and a mass measurement accuracy in the 10 ppm range is demonstrated.

Keywords: time-of-flight, mass spectrometer, high-resolution, reflectron, phase volume, acceptance, orthogonal, injection, electrospray

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