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Ed by John C. Vickerman and David Briggs
Time-of-flight secondary ion mass spectrometry is the most versatile of the surface analysis techniques that have been developed during the last 30 years. Current instrumentation provides a powerful combination of capabilities for molecular detection and trace element determination, imaging and microanalysis, and shallow depth profiling.
This is the first book to be dedicated to the subject and the treatment is comprehensive. Following overview and historical chapters, there are sections devoted to instrumentation and sample handling (three chapters), fundamentals and molecular dynamics simulations (four chapters), optimisation methods—including laser post-ionisation of sputtered neutrals (six chapters), data interpretation (two chapters) and analytical applications (eleven chapters).
All the contributors are internationally recognised as leaders in their respective fields and come from both Europe and the USA.
Hardback
Pages: ix + 789
Published: 2001
CONTENTS
Prologue
ToF-SIMS – An Overview
John C. Vickermanbr/>
The History of Static SIMS: A Personal Perspective
Alfred Benninghoven
Instrumentation
Time-of-Flight Mass Analysers
Bruno W. Schueler
Primary Ion Beam Systems
Rowland Hill
Sample Handling
D. Fraser Reich
Status of Cascade Theory
Herbert M. Urbassek
Fundamental Aspects of Organic SIMS
Arnaud Delcorte
Fundamental Aspects of Inorganic SIMS
Annemie Adriaens, Rita Van Ham and Luc Van Vaeck
Molecular Dynamics Simulations, the Theoretical Partner to Static SIMS Experiments
Barbara J. Garrison
Optimisation Methods
Optimisation of Operating Conditions
Ian Gilmore
Optimisation Methods: Cationisation
Birgit Hagenhoff
Polyatomic Primary Beams
Michael J. van Stipdonk
Laser Post-Ionisation: Fundamentals
Andreas Wucher
Laser Post-ionisation for Quantitative Elemental Analysis
Michael J. Pellin, Wallis F. Calaway and Igor V. Veryovkin
Laser Post-Ionisation for Molecular Analysis
Nicholas P. Lockyer
Data Interpretation
Interpretation of Spectra
David Briggs
ToF-SIMS Image Analysis
Bonnie J. Tyler
Analytical Applications
Surface Characterisation of Polymers
David Briggs
Analysis of Bulk Polymers
Alan A. Galuska
Quantitative Characterisation of Polymer Surfaces
Xavier Vanden Eynde
Studies of Self-Assembled Monolayers
Graham J. Leggett
Biological Systems
Jamal I. Berry, Andrew G. Ewing and Nicholas Winograd
Biomolecules on Surfaces
Ashutosh Chilkoti
Atmospheric Chemistry
Heather A. Gamble
Contamination Monitoring and Failure Analysis
Thomas Fister, Thomas Schuerlein and Patricia Lindley
Applications in Catalysis
Marco J.P. Hopstaken, Ralf Linke, Wouter J. H. van Gennip and J.W. (Hans) Niemantsverdriet
Photographic Materials
Geert Verlinden, Renaat Gijbels and Ingrid Geuens
Dual Beam Depth Profiling
Ewald Niehuis and Thomas Grehl
Subject Index
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