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The LC/MS Applications Database 1991–2003
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Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy
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ToF-SIMS: Surface Analysis by Mass Spectrometry
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A User-Friendly Guide to Multivariate Calibration and Classification
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Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy
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A User-Friendly Guide to Multivariate Calibration and Classification
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Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy
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Reference Materials for Chemical Analysis
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Quality Assurance for Water Analysis
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ToF-SIMS: Surface Analysis by Mass Spectrometry
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A User-Friendly Guide to Multivariate Calibration and Classification
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