Table of Contents ToF-SIMS: Surface Analysis by Mass Spectrometry |
Prologue |
Pages 1 - 40 |
ToF-SIMS - An Overview
John C. Vickerman
Surface Analysis Research Centre, Department of Chemistry, UMIST, Manchester, UK
Pages 41 - 72 |
The History of Static SIMS: A Personal Perspective
Alfred Benninghoven
Physikalisches Institut der Universitä:t Münster,
Instrumentation |
Pages 75 - 94 |
Time-of-Flight Mass Analysers
Bruno W. Schueler
Physical Electronics, 810 Kifer Road, Sunnyvale, CA 94086, USA
Pages 95 - 111 |
Primary Ion Beam Systems
Rowland Hill
Ionoptika Ltd, Epsilon House, Chilworth Science Park, Southampton SO16 7NS, UK
Pages 113 - 135 |
Sample Handling
D. Fraser Reich
Physical Electronics, 810 Kifer Road, Sunnyvale, CA 94086, USA
Pages 139 - 159 |
Status of Cascade Theory
Herbert M. Urbassek
Fachbereich Physik, Universität Kaiserlautern, Erwin-Schrödinger-Straße, D-67663 Kaiserlautern,
Pages 161 - 194 |
Fundamental Aspects of Organic SIMS
Arnaud Delcorte
Unité de Physico-Chimie et de Physique des Matériaux, Université Catholique de Louvain, 1 Croix du Sud, B-1348 Louvain-la-Neuve, Belgium
Pages 195 - 222 |
Fundamental Aspects of Inorganic SIMS
Annemie Adriaens, Rita Van Ham and Luc Van Vaeck
Department of Chemistry, University of Antwerp, Universiteitsplein 1, B-2610 Antwerp, Belgium
Pages 223 - 257 |
Molecular Dynamics Simulations, the Theoretical Partner to Static SIMS Experiments
Barbara J. Garrison
Department of Chemistry, Penn State University, University Park, PA 16802, USA
Optimisation Methods |
Pages 261 - 283 |
Optimisation of Operating Conditions
Ian Gilmore
Centre for Optical and Environmental Mterology, National Physical Laboratory, Teddington, UK
Pages 285 - 308 |
Optimisation Methods: Cationisation
Birgit Hagenhoff
TASCON GmbH, Mendelstr. 11, 48149 Münster,
Pages 309 - 345 |
Polyatomic Primary Beams
Michael J. van Stipdonk
Department of Chemistry, Wichita State University, KS 67, USA
Pages - 373 |
Laser Post-Ionisation: Fundamentals
Andreas Wucher
Institute of Experimental Physics, University of Essen, D-45117 Essen,
Pages 375 - 415 |
Laser Post-ionisation for Quantitative Elemental Analysis
Michael J. Pellin, Wallis F. Calaway and Igor V. Veryovkin
Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA
Pages 417 - 443 |
Laser Post-Ionisation for Molecular Analysis
Nicholas P. Lockyer
Surface Analysis Research Centre, Department of Chemistry, UMIST, Manchester, M60 1QD, UK
Data Interpretation |
Pages 447 - 493 |
Interpretation of Spectra
David Briggs
Centre for Surface Chemical Analysis, University of Nottingham, University Park, Nottingham, NG7 2RD, UK
Pages 475 - 493 |
ToF-SIMS Image Analysis
Bonnie J. Tyler
Department of Chemical and Fuels Engineering, University of Utah, Salt Lake City, UT 84112, USA
Analytical Applications |
Pages 497 - 524 |
Surface Characterisation of Polymers
David Briggs
Centre for Surface Chemical Analysis, University of Nottingham, University Park, Nottingham, NG7 2RD, UK
Pages 525 - 542 |
Analysis of Bulk Polymers
Alan A. Galuska
ExxonMobil Chemical Company, Baytown Polymers Center, 5200 Baytown Drive, Baytown, TX 77, USA
Pages 543 - 571 |
Quantitative Characterisation of Polymer Surfaces
Xavier Vanden Eynde
Université Catholique de Louvain, Unité PCPM, B-1348 Louvain-la-Neuve, Belgium
Pages 573 - 593 |
Studies of Self-Assembled Monolayers
Graham J. Leggett
Department of Chemistry, University of Manchester, Institute of Science and Technology, PO Box 88, Manchester, M60 1QD, UK
Pages 595 - 626 |
Biological Systems
Jamal I. Berry, Andrew G. Ewing and Nicholas Winograd
Department of Chemistry and the Materials Research Institute, Penn State University, 184 Materials Research Institute, University Park, PA 16802, USA
Pages 627 - 650 |
Biomolecules on Surfaces
Ashutosh Chilkoti
Department of Biomedical Engineering, Campus Box 90281, Duke University, Durham, NC 27708, USA
Pages 651 - 672 |
Atmospheric Chemistry
Heather A. Gamble
Unisearch Associates Inc., 96 Bradwick Drive, Concord, Ontario, Canada, L4K 1K8
Pages 673 - 695 |
Contamination Monitoring and Failure Analysis
Thomas Fister, Thomas Schuerlein and Patricia Lindley
Charles Evans & Associates, 810 Kifer Road, Sunnyvale, CA 94086, USA
Pages 697 - 725 |
Applications in Catalysis
Marco J.P. Hopstaken, Ralf Linke, Wouter J. H. van Gennip and J.W. (Hans) Niemantsverdriet
Schuit Institute of Catalysis, Eindhoven University of Technology, 5600 MB Eindhoven, The Netherlands
Pages 727 - 752 |
Photographic Materials
Geert Verlinden, Renaat Gijbels and Ingrid Geuens
Department of Chemistry, University of Antwerp, Universiteitsplein 1, B-2610 Wilrijk, Belgium
Agfa Gevaert NV, B-2640 Mortsel, Belgium
Pages 753 - 778 |
Dual Beam Depth Profiling
Ewald Niehuis and Thomas Grehl
ION-TOF GmbH, Mendelstr 11, 48149 Münster,
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