Table of Contents ToF-SIMS: Surface Analysis by Mass Spectrometry


Prologue


Pages 1 - 40

ToF-SIMS - An Overview

John C. Vickerman
Surface Analysis Research Centre, Department of Chemistry, UMIST, Manchester, UK

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Pages 41 - 72

The History of Static SIMS: A Personal Perspective

Alfred Benninghoven
Physikalisches Institut der Universitä:t Münster,

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Instrumentation


Pages 75 - 94

Time-of-Flight Mass Analysers

Bruno W. Schueler
Physical Electronics, 810 Kifer Road, Sunnyvale, CA 94086, USA

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Pages 95 - 111

Primary Ion Beam Systems

Rowland Hill
Ionoptika Ltd, Epsilon House, Chilworth Science Park, Southampton SO16 7NS, UK

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Pages 113 - 135

Sample Handling

D. Fraser Reich
Physical Electronics, 810 Kifer Road, Sunnyvale, CA 94086, USA

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Pages 139 - 159

Status of Cascade Theory

Herbert M. Urbassek
Fachbereich Physik, Universität Kaiserlautern, Erwin-Schrödinger-Straße, D-67663 Kaiserlautern,

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Pages 161 - 194

Fundamental Aspects of Organic SIMS

Arnaud Delcorte
Unité de Physico-Chimie et de Physique des Matériaux, Université Catholique de Louvain, 1 Croix du Sud, B-1348 Louvain-la-Neuve, Belgium

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Pages 195 - 222

Fundamental Aspects of Inorganic SIMS

Annemie Adriaens, Rita Van Ham and Luc Van Vaeck
Department of Chemistry, University of Antwerp, Universiteitsplein 1, B-2610 Antwerp, Belgium

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Pages 223 - 257

Molecular Dynamics Simulations, the Theoretical Partner to Static SIMS Experiments

Barbara J. Garrison
Department of Chemistry, Penn State University, University Park, PA 16802, USA

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Optimisation Methods


Pages 261 - 283

Optimisation of Operating Conditions

Ian Gilmore
Centre for Optical and Environmental Mterology, National Physical Laboratory, Teddington, UK

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Pages 285 - 308

Optimisation Methods: Cationisation

Birgit Hagenhoff
TASCON GmbH, Mendelstr. 11, 48149 Münster,

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Pages 309 - 345

Polyatomic Primary Beams

Michael J. van Stipdonk
Department of Chemistry, Wichita State University, KS 67, USA

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Pages - 373

Laser Post-Ionisation: Fundamentals

Andreas Wucher
Institute of Experimental Physics, University of Essen, D-45117 Essen,

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Pages 375 - 415

Laser Post-ionisation for Quantitative Elemental Analysis

Michael J. Pellin, Wallis F. Calaway and Igor V. Veryovkin
Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA

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Pages 417 - 443

Laser Post-Ionisation for Molecular Analysis

Nicholas P. Lockyer
Surface Analysis Research Centre, Department of Chemistry, UMIST, Manchester, M60 1QD, UK

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Data Interpretation


Pages 447 - 493

Interpretation of Spectra

David Briggs
Centre for Surface Chemical Analysis, University of Nottingham, University Park, Nottingham, NG7 2RD, UK

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Pages 475 - 493

ToF-SIMS Image Analysis

Bonnie J. Tyler
Department of Chemical and Fuels Engineering, University of Utah, Salt Lake City, UT 84112, USA

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Analytical Applications


Pages 497 - 524

Surface Characterisation of Polymers

David Briggs
Centre for Surface Chemical Analysis, University of Nottingham, University Park, Nottingham, NG7 2RD, UK

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Pages 525 - 542

Analysis of Bulk Polymers

Alan A. Galuska
ExxonMobil Chemical Company, Baytown Polymers Center, 5200 Baytown Drive, Baytown, TX 77, USA

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Pages 543 - 571

Quantitative Characterisation of Polymer Surfaces

Xavier Vanden Eynde
Université Catholique de Louvain, Unité PCPM, B-1348 Louvain-la-Neuve, Belgium

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Pages 573 - 593

Studies of Self-Assembled Monolayers

Graham J. Leggett
Department of Chemistry, University of Manchester, Institute of Science and Technology, PO Box 88, Manchester, M60 1QD, UK

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Pages 595 - 626

Biological Systems

Jamal I. Berry, Andrew G. Ewing and Nicholas Winograd
Department of Chemistry and the Materials Research Institute, Penn State University, 184 Materials Research Institute, University Park, PA 16802, USA

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Pages 627 - 650

Biomolecules on Surfaces

Ashutosh Chilkoti
Department of Biomedical Engineering, Campus Box 90281, Duke University, Durham, NC 27708, USA

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Pages 651 - 672

Atmospheric Chemistry

Heather A. Gamble
Unisearch Associates Inc., 96 Bradwick Drive, Concord, Ontario, Canada, L4K 1K8

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Pages 673 - 695

Contamination Monitoring and Failure Analysis

Thomas Fister, Thomas Schuerlein and Patricia Lindley
Charles Evans & Associates, 810 Kifer Road, Sunnyvale, CA 94086, USA

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Pages 697 - 725

Applications in Catalysis

Marco J.P. Hopstaken, Ralf Linke, Wouter J. H. van Gennip and J.W. (Hans) Niemantsverdriet
Schuit Institute of Catalysis, Eindhoven University of Technology, 5600 MB Eindhoven, The Netherlands

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Pages 727 - 752

Photographic Materials

Geert Verlinden, Renaat Gijbels and Ingrid Geuens
Department of Chemistry, University of Antwerp, Universiteitsplein 1, B-2610 Wilrijk, Belgium
Agfa Gevaert NV, B-2640 Mortsel, Belgium

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Pages 753 - 778

Dual Beam Depth Profiling

Ewald Niehuis and Thomas Grehl
ION-TOF GmbH, Mendelstr 11, 48149 Münster,

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