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Near-Infrared Spectroscopy: Principles, Instruments, Applications
[3-527-301496]
£95.00
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Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy
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ToF-SIMS: Surface Analysis by Mass Spectrometry
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A User-Friendly Guide to Multivariate Calibration and Classification
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Near-Infrared Spectroscopy: Principles, Instruments, Applications
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Monday 25 September, 2006
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